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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 期刊論文 >  Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/12381

    Title: Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique
    Authors: Chang, M.-F.
    Chiou, L.-Y.
    Wen, K.-A.
    教師: 張孟凡
    Date: 2005
    Publisher: Institute of Electrical and Electronics Engineers Inc.
    Relation: ELECTRONICS LETTERS   Volume: 41   Issue: 15   Pages: 834-835   Published: JUL 21 2005
    Keywords: Integrated circuit
    Noise reduction
    Shielding effect
    Abstract: A dynamic bitline shielding (DBS) technique is proposed for high-speed via-programming ROMs, to eliminate code-pattern-dependent crosstalk-induced read failure (CIRF) and increase code-pattern coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.
    Relation Link: http://www.theiet.org/
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/12381
    Appears in Collections:[電機工程學系] 期刊論文
    [電子工程研究所] 期刊論文
    [積體電路設計技術研發中心] 期刊論文

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