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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 期刊論文 >  A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/12569

    Title: A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations
    Authors: Cheng,Hsiu-Yu
    Date: 2003
    Publisher: Institute of Electrical and Electronics Engineers Inc.
    Keywords: Image sensors
    CMOS integrated circuits
    Logic design
    Leakage currents
    Abstract: An ultralow dark-signal and high-sensitivity pixel has been developed for an embedded active-pixel CMOS image sensor by using a standard 0.35-μm CMOS logic process. To achieve in-pixel dark-current cancellation, we developed a combined photogate/photodiode photon-sensing device with a novel operation scheme. The experimental results demonstrate that the severe dark signal degradation of a CMOS active pixel sensor is reduced more than an order of magnitude. Through varying the bias conditions on the photogate, dynamic sensitivity can Combining the above two operation schemes, the dynamic range of this new cell can be extended by more than 20 ×.
    Relation Link: http://www.ieee.org/portal/site
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/12569
    Appears in Collections:[電機工程學系] 期刊論文
    [電子工程研究所] 期刊論文

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