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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 期刊論文 >  A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/12581


    Title: A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations
    Authors: Cheng HY
    King YC
    Date: 2003
    Publisher: Institute of Electrical and Electronics Engineers Inc.
    Keywords: CMOS image sensor
    dark current
    dynamic range
    Abstract: An ultralow. dark-signal and high-sensitivity pixel has been developed for an embedded active-pixel CMOS image sensor by using a standard 0.35-mum CMOS. logic process. To achieve in-pixel dark-current cancellation, we developed a combined photogate/photodiode photon-sensing device with a novel operation scheme. The experimental results demonstrate that the severe dark signal degradation of a CMOS active pixel sensor is reduced more than an order of magnitude. Through varying the bias conditions on the photogate, dynamic sensitivity can be obtained to increase maximum allowable illumination level. Combining the above two operation schemes, the dynamic range of this new cell can be extended by more than 20 x.
    Relation Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1185168
    http://www.ieee.org/portal/site
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/12581
    Appears in Collections:[電機工程學系] 期刊論文
    [電子工程研究所] 期刊論文

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