National Tsing Hua University Institutional Repository:Accurate and efficient inductance extraction for SoC noise and signal integrity
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    NTHUR > College of Electrical Engineering and Computer Science > Department of Computer Science > CS Conference Papers >  Accurate and efficient inductance extraction for SoC noise and signal integrity

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    Title: Accurate and efficient inductance extraction for SoC noise and signal integrity
    Authors: Li-Fu Chang
    Chang, K.-J.
    Date: 2002
    Publisher: Institute of Electrical and Electronics Engineers Inc
    Keywords: circuit simulation
    computational electromagnetics
    eddy currents
    high-speed integrated circuits
    integrated circuit interconnections
    integrated circuit modelling
    integrated circuit noise
    skin effect
    Abstract: With the advent of 500 MHz+ SoC designs, recent intensive on-chip inductance research and publications from academia and semiconductor industry have resulted in early adoptions of interconnect inductance extraction tools by state-of-the-art SoC designers for noise and signal integrity modeling. For those early tool developers and adopters, we propose a set of comprehensive criteria toward an on-chip inductance gold standard to insure accuracy. The three essential criteria for an inductance gold standard we propose are: (1) accurate partial inductance formulae; (2) rigorous 3-D electromagnetic field simulations; (3) comprehensive eddy-current-limited loop and mutual inductance extraction. After brief descriptions of three widely used empirical inductance modeling equations, the necessity of a PEEC-based 3-D electromagnetic field simulation is explained by using nanometer-technology-based SoC interconnect cases. For accurate noise and signal integrity predictions, synthesizing RLCK netlists for SPICE-level circuit simulators is then performed to depict the effects caused by the eddy-current-limited loop and mutual inductance extracted using the gold standard.
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    Appears in Collections:[Department of Computer Science] CS Conference Papers
    [Design Technology Center ] DTC Conference Papers

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