English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14427100      Online Users : 41
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 工學院  > 工業工程與工程管理學系 > 期刊論文 >  Analyzing repair decisions in the site imbalance problem of semiconductor test machines


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/36660


    Title: Analyzing repair decisions in the site imbalance problem of semiconductor test machines
    Authors: Chen-Fu Chien;Jei-Zheng Wu
    教師: 簡禎富
    Date: 2003
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: IEEE Transactions on Semiconductor Manufacturing, Volume 16, Issue 4, Nov. 2003, pages 704 - 711
    Keywords: decision support systems
    decision trees
    electronic engineering computing
    integrated circuit testing
    maintenance engineering
    semiconductor process modelling
    Abstract: © 2003 Institute of Electrical and Electronics Engineers - Test machines can test multiple IC devices simultaneously. When testing the same group of devices, unusual deviations in yield rates of specific sites from the other sites (i.e., site imbalance) imply a fault in the corresponding sites and the machine. This study develops a decision analysis framework for maximizing profit and customer satisfaction under uncertain conditions. The proposed framework can provide the on-site operators specific decision rules to help decide whether they should continue the test, close specific sites, or shut the machine down to repair it. A numerical example is used for illustration.
    URI: http://www.ieee.org/
    http://nthur.lib.nthu.edu.tw/handle/987654321/36660
    Appears in Collections:[工業工程與工程管理學系] 期刊論文

    Files in This Item:

    File SizeFormat
    0KbUnknown1086View/Open


    在NTHUR中所有的資料項目都受到原著作權保護,僅提供學術研究及教育使用,敬請尊重著作權人之權益。若須利用於商業或營利,請先取得著作權人授權。
    若發現本網站收錄之內容有侵害著作權人權益之情事,請權利人通知本網站管理者(smluo@lib.nthu.edu.tw),管理者將立即採取移除該內容等補救措施。

    SFX Query

    與系統管理員聯絡

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback