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    National Tsing Hua University Institutional Repository > 原子科學院  > 工程與系統科學系 > 會議論文  >  In-situ study of SAMs growth process by cross analysis of AFM height and lateral deflection

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/47201

    Title: In-situ study of SAMs growth process by cross analysis of AFM height and lateral deflection
    Authors: Chun-Lung Wu;Fan-Gang Tseng;Ching-Chang Chieng
    教師: 錢景常
    Date: 2005
    Publisher: Nano Science and Technology Institute
    Relation: 2005 NSTI Nanotechnology Conference and Trade Show. NSTI Nanotech 2005, 2005, p 408-11
    Keywords: atomic force microscopy
    organic compounds
    Abstract: This paper introduces a novel way to investigate SAMs growth process by cross analysis of the information of AFM height and lateral deflection scanning results. The traditional ways by analysis of AFM height and histogram data can not differentiate the molecular growth detail behavior of alkylsinae SAMs because the images captured by AFM are static and lack molecular level information. Thus, this paper proposes to employ the standard deviation of AFM data to analyze the in-situ growth behaviors of alkylsinae SAMs in comparison with the local height and lateral deflection data. The analysis results demonstrated close correlation of the SAMs growth process among the aforementioned data analysis methods
    URI: http://www.nsti.org/procs/Nanotech2005v2/5/W913.09
    Appears in Collections:[工程與系統科學系] 會議論文

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