English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14501423      Online Users : 85
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/83580

    Title: Diagnosis of MRAM write disturbance fault
    Authors: C.-L. Su;C.-W. Tsai;C.-Y. Chen;W.-Y. Lo;C.-W. Wu;J.-J. Chen;W.-C. Wu;C.-C. Hung;M.-J. Kao
    教師: 吳誠文
    Date: 2010
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, Institute of Electrical and Electronics Engineers, Volume 18, Issue 12, DEC 2010, Pages 1762-1766
    Keywords: MEMORY
    Abstract: In this paper, we propose a new test method to detect write disturbance fault (WDF) for magnetic RAM (MRAM). Furthermore, an adaptive diagnosis algorithm (ADA) is also introduced to identify and diagnose the WDF for MRAM. The proposed test method can evaluate process stability and uniformity. We also develop a built-in self-test (BIST) circuit that supports the proposed WDF diagnosis test method. A 1-Mb toggle MRAM prototype chip with the proposed BIST circuit has been designed and fabricated using a special 0.15-mu m CMOS technology. The BIST circuit overhead is only about 0.05% with respect to the 1-Mb MRAM. The test time is reduced by about 30% as compared with the test method without using the decision write mechanism. The chip measurement results show the efficiency of our proposed method.
    Relation Link: http://www.ieee.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/83580
    Appears in Collections:[電機工程學系] 期刊論文
    [電腦與通訊科技研發中心] 期刊論文
    [資訊工程學系] 期刊論文

    Files in This Item:

    File Description SizeFormat


    SFX Query


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback