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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 期刊論文 >  Delay defect diagnosis based upon a statistical timing model - the first step


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/12047


    Title: Delay defect diagnosis based upon a statistical timing model - the first step
    Authors: Krstic A
    Wang LC
    Cheng KT
    Liou JJ
    Abadir MS
    教師: 劉靖家
    Date: 2003
    Publisher: Institute of Electrical and Electronics Engineers Inc.
    Relation: Computers and Digital Techniques, IEE Proceedings -
    Volume 150, Issue 5, 22 Sept. 2003 Page(s):346-54
    Computers and Digital Techniques, IEE Proceedings - Volume 150, Issue 5, 22 Sept. 2003 Page(s):346-54
    Keywords: delays
    fault diagnosis
    network analysis
    statistical analysis
    Abstract: The problem of diagnosing delay defects is defined using a statistical timing model. The differences between delay defect diagnosis and traditional logic defect diagnosis are illustrated. Different diagnosis algorithms are proposed and their performance evaluated via statistical defect injection and, statistical delay fault simulation. With a statistical timing analysis framework developed in the past, new concepts in delay defect diagnosis are demonstrated and experimental results are discussed based upon benchmark circuits.
    Relation Link: http://webservices.ieee.org/pindex_basic.html
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/12047
    Appears in Collections:[電機工程學系] 期刊論文
    [積體電路設計技術研發中心] 期刊論文

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