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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 資訊工程學系 > 期刊論文 >  Charge-sharing alleviation and detection for CMOS domino circuits


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/12729


    Title: Charge-sharing alleviation and detection for CMOS domino circuits
    Authors: Shih-Chieh Chang
    Ching-Hwa Cheng
    Wen-Ben Jone
    Shin-De Lee
    Jinn-Shyan Wang
    Date: 2001
    Publisher: Institute of Electrical and Electronics Engineers Inc
    Keywords: CMOS logic circuits
    fault diagnosis
    logic gates
    logic testing
    Abstract: Charge sharing, which occurs in any complementary metal-oxide-semiconductor (CMOS) domino gate, may degrade the output voltage level or may even cause an erroneous output value. In this paper, this problem is thoroughly investigated by considering circuit topology and circuit function. We describe a method to measure the sensitivity [called charge-sharing (CS) vulnerability] of the CS problem for each domino gate. A method to derive the CS vulnerability and the test vector for each domino gate is suggested. We also propose a transistor reordering method to dramatically reduce the CS vulnerabilities for all domino gates so that the CS problem can be alleviated. We also prove theoretically that a set of test vectors generated for single charge-sharing faults (SCSFs) can also detect all multiple charge-sharing faults (MCSFs). This good property significantly guarantees the test quality for the CS faults of domino circuits.
    Relation Link: http://webservices.ieee.org/pindex_basic.html
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/12729
    Appears in Collections:[資訊工程學系] 期刊論文
    [積體電路設計技術研發中心] 期刊論文

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