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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Delay defect diagnosis based upon statistical timing models - the first step [logic testing]


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/12973


    Title: Delay defect diagnosis based upon statistical timing models - the first step [logic testing]
    Authors: Krstic, A.
    Wang, L.-C.
    Kwang-Ting Cheng
    Jing-Jia Liou
    Abadir, M.S.
    教師: 劉靖家
    Date: 2003
    Publisher: Institute of Electrical and Electronics Engineers Inc.
    Relation: Design, Automation and Test in Europe Conference and Exhibition, 2003
    2003 Page(s):328 - 333
    Keywords: automatic test pattern generation
    fault diagnosis
    logic simulation
    logic testing
    statistical analysis timing
    Abstract: This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between delay defect diagnosis and traditional logic defect diagnosis. We propose different diagnosis algorithms, and evaluate their performance via statistical defect injection and statistical delay fault simulation. With a statistical timing analysis framework developed in the past, we demonstrate the new concepts in delay defect diagnosis, and discuss experimental results based upon benchmark circuits.
    Relation Link: http://webservices.ieee.org/pindex_basic.html
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/12973
    Appears in Collections:[電機工程學系] 會議論文
    [積體電路設計技術研發中心] 會議論文

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