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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Low-Loss Single and Differential Semi-Coaxial Interconnects in Standard CMOS Process

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/13002

    Title: Low-Loss Single and Differential Semi-Coaxial Interconnects in Standard CMOS Process
    Authors: Jun-De Jin
    Hsu, S.S.H.
    Ming-Ta Yang
    Liu, S.
    教師: 徐碩鴻
    Date: 2006
    Publisher: Institute of Electrical and Electronics Engineers Inc.
    Keywords: Low-Loss
    Abstract: The low-loss single semi-coaxial (S-SC) and differential semi-coaxial (D-SC) interconnects based on a standard 0.18-mum CMOS process are presented for the first time. Compared to the attenuation constant (alpha) reported for microstrip and CPW interconnects in CMOS process, the S-SC line shows the lowest loss of 0.90 dB/mm at 50 GHz. The D-SC line also presents a very low differential-mode alpha of ~1.00 dB/mm at high frequencies. The characteristics of D-SC lines for differential-mode and common-mode are also investigated in details based on the measured mixed-mode S-parameters
    Relation Link: http://www.ieee.org/portal/site
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/13002
    Appears in Collections:[電機工程學系] 會議論文
    [電子工程研究所] 會議論文
    [奈米工程與微系統研究所] 會議論文

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