English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14663995      Online Users : 87
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Towards the logic defect diagnosis for partial-scan designs

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/13021

    Title: Towards the logic defect diagnosis for partial-scan designs
    Authors: Shi-Yu Huang
    教師: 黃錫瑜
    Date: 2001
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Design Automation Conference, 2001. Proceedings of the ASP-DAC 2001. Asia and South Pacific
    30 Jan.-2 Feb. 2001 Page(s):313 - 318
    Keywords: VLSI
    Abstract: Local defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fail testing. In the last decade, algorithms for diagnosis have progressed significantly and the results are showing promise for full-scan designs. In this paper, we first review several classical algorithms such as fault dictionary based analysis and effect cause analysis. Then, we discuss several diagnosis algorithms borrowed from the design debugging techniques. These algorithms do not require a pre-determined fault model, and thus, are more flexible and applicable to ICs in which the defects do not behave like common stuck-at or bridging faults. Finally, we will probe the possibility of extending these algorithms to designs with only partial-scan support.
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/13021
    Appears in Collections:[電機工程學系] 會議論文
    [積體電路設計技術研發中心] 會議論文

    Files in This Item:

    File Description SizeFormat
    2030172030014.pdf667KbAdobe PDF619View/Open


    SFX Query


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback