National Tsing Hua University Institutional Repository:Towards the logic defect diagnosis for partial-scan designs
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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Towards the logic defect diagnosis for partial-scan designs


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    题名: Towards the logic defect diagnosis for partial-scan designs
    作者: Shi-Yu Huang
    教師: 黃錫瑜
    日期: 2001
    出版者: Institute of Electrical and Electronics Engineers
    關聯: Design Automation Conference, 2001. Proceedings of the ASP-DAC 2001. Asia and South Pacific
    30 Jan.-2 Feb. 2001 Page(s):313 - 318
    关键词: VLSI
    full-scan
    partial-scan
    IC
    摘要: Local defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fail testing. In the last decade, algorithms for diagnosis have progressed significantly and the results are showing promise for full-scan designs. In this paper, we first review several classical algorithms such as fault dictionary based analysis and effect cause analysis. Then, we discuss several diagnosis algorithms borrowed from the design debugging techniques. These algorithms do not require a pre-determined fault model, and thus, are more flexible and applicable to ICs in which the defects do not behave like common stuck-at or bridging faults. Finally, we will probe the possibility of extending these algorithms to designs with only partial-scan support.
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/13021
    显示于类别:[電機工程學系] 會議論文
    [積體電路設計技術研發中心] 會議論文

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