English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 13681482      Online Users : 131
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  An access timing measurement unit of embedded memory


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/13445


    Title: An access timing measurement unit of embedded memory
    Authors: Shu-Rong Lee
    Ming-Jun Hsiao
    Tsin-Yuan Chang
    教師: 張慶元
    Date: 2002
    Publisher: Institute of Electrical and Electronics Engineers Inc.
    Relation: Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian 18-20 Nov. 2002 Page(s):104 - 109
    Keywords: CMOS integrated circuits
    built-in self test
    comparators
    integrated circuit measurement
    integrated circuit testing
    Abstract: As deep sub-micron techniques evolve, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to access limitations. To solve the testing problem, BIST circuits are developed for testing the functionality of embedded memory, but not for the AC parameters. Based on the dual-slope principle, a new memory access time measurement unit for embedded memories with separate time-to-voltage and voltage-to-time architecture is proposed in this paper to achieve at-speed measurement with 50 ps resolution, where the measurement error is smaller than one LSB, and the linearity error is 1.19%. In conjunction with the March-based BIST circuit, the chip area is 262/spl times/92 /spl mu/m/sup 2/ under a 0.35 /spl mu/m 2P4M CMOS process.
    Relation Link: http://www.ieee.org/portal/site
    URI: http://nthur.lib.nthu.edu.tw/handle/987654321/13445
    Appears in Collections:[電機工程學系] 會議論文
    [積體電路設計技術研發中心] 會議論文

    Files in This Item:

    File Description SizeFormat
    2030110030013.pdf468KbAdobe PDF2155View/Open


    在NTHUR中所有的資料項目都受到原著作權保護,僅提供學術研究及教育使用,敬請尊重著作權人之權益。若須利用於商業或營利,請先取得著作權人授權。
    若發現本網站收錄之內容有侵害著作權人權益之情事,請權利人通知本網站管理者(smluo@lib.nthu.edu.tw),管理者將立即採取移除該內容等補救措施。

    SFX Query

    與系統管理員聯絡

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback