National Tsing Hua University Institutional Repository:
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 54367/62174 (87%)
造访人次 : 14171350      在线人数 : 47
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    專利 [86/137]
    專書論文 [2/4]
    技術報告 [4/4]
    會議論文 [2108/2262]
    期刊論文 [1492/1581]
    考古題 [19/19]


    電機工程學系 [4796/7374]
    光電工程研究所 [85/113]
    資訊系統與應用研究所 [517/532]
    通訊工程研究所 [666/684]
    電子工程研究所 [187/211]
    電機資訊學院學士班 [271/290]




    最后更新时间: 2020-02-24 14:20





    RSS Feed RSS Feed
    由新到旧排序 由最旧的开始

    显示项目1-25 / 4005. (共161页)
    1 2 3 4 5 6 7 8 9 10 > >>

    2011 Cost modeling and analysis for interposer-based three-dimensional IC Y.-W. Chou; P.-Y. Chen; M. Lee; C.-W. Wu
    2011 A memory failure pattern analyzer for memory diagnosis and repair B.-Y. Lin; M. Lee; C.-W. Wu
    2011 Multi-visit TAMs to reduce the post-bond test length of 2.5D-SICs with a passive silicon interposer base C.-C. Chi; E. J. Marinissen; S. K. Goel; C.-W. Wu
    2011 Post-bond testing of 2.5D-SICs and 3D-SICs containing a passive silicon interposer base C.-C. Chi; E. J. Marinissen; S. K. Goel; C.-W. Wu
    2011 Built-in self-forming, built-in self-test, and built-in self-repair for RRAM yield improvement C.-Y. Chen; H.-C. Shih; M. Lee; C.-W. Wu; C.-H. Lin; S.-S. Sheu
    2011 A low-cost wireless interface with no external antenna and crystal oscillator for cm-range contactless testing C.-F. Li; C.-Y. Lee; C.-H. Wang; S.-L. Chang; Y.-S. Kuo; L.-M. Denq; C.-C. Chi; T.-Y. Chang; H.-J. Hsu; M.-Y. Chu; C.-T. Huang; J.-J. Liou; S.-Y. Huang; P.-C. Huang; H.-P. Ma; J.-C. Bor; C.-C. Tien; C.-H. Wang; C.-W. Wu
    2011 DfT architecture for 3D-SICs with multiple towers C.-C. Chi; E. J. Marinissen; S. K. Goel; C.-W. Wu
    2011 A built-in self-test scheme for the post-bond test of TSVs in 3D Ics Y.-J. Huang; J.-F. Li; J.-J. Chen; D.-M. Kwai; Y.-F. Chou; C.-W. Wu
    2011 Training-based forming process for RRAM yield improvement H.-C. Shih; C.-Y. Chen; C.-W. Wu; C.-H. Lin; S.-S. Sheu
    2011 A self-testing and calibration method for embedded successive approximation register ADC X.-L. Huang; P.-Y. Kang; H.-M. Chang; J.-L. Huang; Y.-F. Chou; Y.-P. Lee; D.-M. Kwai; C.-W. Wu
    2010 A test integration methodology for 3D integrated circuits C.-W. Chou; J.-F. Li; J.-J. Chen; D.-M. Kwai; Y.-F. Chou; C.-W. Wu
    2010 Is 3D integration the way out of the crossroads? D.-M. Kwai; Y.-F. Chou; C.-W. Wu
    2010 AF-Test: Adaptive-frequency scan test methodology for small-delay defects T.-Y. Lee; S.-Y. Huang; H.-J. Hsu; C.-W. Tzeng; C.-T. Huang; J.-J. Liu; H.-P. Ma; P.-C. Huang; J.-C. Bor; C.-W. Wu; C.-C. Tien; M. Wang
    2010 Is automotive electronics creating new opportunities for semiconductor? C.-W. Wu; J.-J. Tang
    2010 Is 3D integration an opportunity or just a hype? J.-F. Li; C.-W. Wu
    2011 Yield enhancement by bad-die recycling and stacking with though-silicon vias Y.-F. Chou; D.-M. Kwai; C.-W. Wu
    2011 Speeding up emulation based diagnosis techniques for logic cores S.-K. Lu; S.-Y. Huang; C.-W. Wu; Y.-M. Chen
    2011 A memory built-in self-repair scheme based on configurable spares M. Lee; L.-M. Denq; C.-W. Wu
    2010 Diagnosis of MRAM write disturbance fault C.-L. Su; C.-W. Tsai; C.-Y. Chen; W.-Y. Lo; C.-W. Wu; J.-J. Chen; W.-C. Wu; C.-C. Hung; M.-J. Kao
    2010 SOC test architecture and method for 3D Ics C.-Y. Lo; Y.-T. Hsing; L.-M. Denq; C.-W. Wu
    2010 A built-in self-diagnosis and repair design with fail pattern identification for memories C.-L. Su; R.-F. Huang; C.-W. Wu; K.-L. Luo; W.-C. Wu
    2010 An efficient multi-mode multiplier supporting AES and fundamental operations of public-key cryptosystems C.-H. Wang; C.-L. Chuang; C.-W. Wu
    2013 Evaluation and Analysis of Spectrum-Based Fault Localization with Modified Similarity Coefficients for Software Debugging Y. S. You; C. Y. Huang; K. L. Peng; C. J. Hsu
    2012 Reliability Assessment and Analysis of Incorporating Fault Tolerance into Service-Oriented Architectural Systems K. L. Peng; C. Y. Huang
    2012 A Study of Using Two-Parameter Generalized Pareto Model to Analyze the Fault Distribution of Open Source Software C. S. Kuo; C. Y. Huang; S. P. Luan

    显示项目1-25 / 4005. (共161页)
    1 2 3 4 5 6 7 8 9 10 > >>

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈