English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14159335      Online Users : 78
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 工學院  > 工業工程與工程管理學系 > 期刊論文 >  A UNISON framework for analyzing alternative strategies of IC final testing for enhancing overall operational effectiveness


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/36634


    Title: A UNISON framework for analyzing alternative strategies of IC final testing for enhancing overall operational effectiveness
    Authors: Chen-Fu Chien;Hung-Ju Wang;Min Wang
    教師: 簡禎富
    Date: 2007
    Publisher: Elsevier
    Relation: International Journal of Production Economics, Volume 107, Issue 1, May 2007, Pages 20-30
    Keywords: Decision analysis
    IC final test
    Semiconductor manufacturing
    Operational effectiveness
    Manufacturing strategy
    Abstract: © 2007 Elsevier - Owing to capacity limit, yield demand, and cycle time reduction, determining proper strategy for the final testing of integrated circuits (IC) device is critical. Since none of the tests can perfectly distinguish good devices from bad, alternative testing strategies consisting of various setups and testing procedures affect the testing results and testing cycle time. However, this problem has seldom been addressed in literature. This study aims to construct a decision framework to analyze alternative testing strategies and thus derive the optimal strategy balancing operational efficiency, cost, and risk. This framework has been implemented in a semiconductor-testing firm in Taiwan. The results demonstrate practical viability of the proposed framework.
    URI: http://www.elsevier.com/
    http://nthur.lib.nthu.edu.tw/handle/987654321/36634
    Appears in Collections:[工業工程與工程管理學系] 期刊論文

    Files in This Item:

    File SizeFormat
    0KbUnknown678View/Open


    在NTHUR中所有的資料項目都受到原著作權保護,僅提供學術研究及教育使用,敬請尊重著作權人之權益。若須利用於商業或營利,請先取得著作權人授權。
    若發現本網站收錄之內容有侵害著作權人權益之情事,請權利人通知本網站管理者(smluo@lib.nthu.edu.tw),管理者將立即採取移除該內容等補救措施。

    SFX Query

    與系統管理員聯絡

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback