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    National Tsing Hua University Institutional Repository > 工學院  > 化學工程學系 > 期刊論文 >  Trap levels and effect of oxygen in poly[2-methoxy-5- (2-ethyl-hexyloxy)-1,4-phenylene vinylene] diodes


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/39728


    Title: Trap levels and effect of oxygen in poly[2-methoxy-5- (2-ethyl-hexyloxy)-1,4-phenylene vinylene] diodes
    Authors: H. Tzeng;S. A. Chen
    教師: 陳壽安
    Date: 2002
    Publisher: American Institute of Physics
    Relation: Applied Physics Letters, American Institute of Physics, Volume 80, Issue 11, 2002, Pages 2017-2019
    Keywords: light-emitting-diodes
    electroluminescent conjugated polymers
    poly
    luminescence
    transport
    electron
    devices
    film
    ppv
    Abstract: ©2002 AIP - We investigated carrier transport and capture in poly[2-methoxy-5-(2-ethyl-hexyloxy)1,4-phenylene vinylene] Schottky diodes by thermally stimulated currents and current–voltage characteristics. Two main charge traps were found after the white light excitation. Their effective activation energies were in the ranges 0.207–0.355 eV and 0.75–0.91 eV, and the total charges were up to (2–8)×1014 cm–3 and ~(1–2)×1016 cm–3 respectively. The activation energy and level filling could be increased significantly by exposing the sample to the air. The deeper trap is likely located near the surface, meanwhile the shallower trap is most probably distributed over the sample depth. As far as these traps are related to the oxygen, both of them could be identified as electron traps. In contrast, none of the traps could be recharged by applied voltage. Instead, the injected carriers created a long-living sample polarization. The nonexponential depolarization lasted for several thousands of seconds and was not thermally activated even above the glass transition temperature. These facts make it necessary to include into analysis other possible physicochemical mechanisms, e.g., reversible chemical reactions or chain structure reorganization induced by electric field.
    URI: http://www.aip.org/
    http://nthur.lib.nthu.edu.tw/handle/987654321/39728
    Appears in Collections:[化學工程學系] 期刊論文

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