National Tsing Hua University Institutional Repository:Disorder controlled hole transport in MEH-PPV
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14652797      Online Users : 75
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    NTHUR > College of Engineering  > Department of Chemical Engineering  > CHE Journal / Magazine Articles  >  Disorder controlled hole transport in MEH-PPV

    Please use this identifier to cite or link to this item:

    Title: Disorder controlled hole transport in MEH-PPV
    Authors: Anto Regis Inigo;Hsiang-Chih Chiu;Wunshain Fann;Ying-Sheng Huang;U-Ser Jeng;Tsang-Lang Lin;Chia-Hung Hsu;Kang-Yung Peng;Show-An Chen
    Teacher: 陳壽安
    Date: 2004
    Publisher: American Physical Society
    Relation: PHYSICAL REVIEW B, American Physical Society, Volume 69, Issue 7, FEB 2004
    Keywords: molecularly doped polymers
    conjugated polymers
    interchain interactions
    film morphology
    device performance
    polar additives
    Abstract: ©2004 APS - We analyze the correlation between nanostructure and charge transport in poly(2-methoxy,5-(2ethyl-hexyloxy)-p-phenylene vinylene) (MEH-PPV) films. The MEH-PPV films prepared in toluene (TL) as well as chlorobenzene (CB) solvents were investigated using the time-of-flight method and x-ray scattering. Nondispersive hole transport was observed at room temperature in devices prepared from both solutions. The field and temperature-dependent mobility were analyzed by the Gaussian disorder transport model. The positional disorder parameter in CB is larger than that in TL films. Both energy and position disorders affect the transport property in the devices from CB whereas only energy disorder affects this property in devices from TL. Correspondingly, according to the x-ray scattering measurements, the TL-cast films have larger chain-packed domains and less order-disorder transition interfaces than those for CB-cast films, along the surface normal, i.e., the charge transport direction.
    Appears in Collections:[Department of Chemical Engineering ] CHE Journal / Magazine Articles

    Files in This Item:

    File Description SizeFormat
    2020116010090.pdf161KbAdobe PDF614View/Open


    SFX Query


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback