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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機資訊學院學士班 > 期刊論文 >  Control and observation structures for analog circuits

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42003

    Title: Control and observation structures for analog circuits
    Authors: Yeong-Ruey Sheh;Cheng-Wen Wu
    教師: 吳誠文
    Date: 1998
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Design & Test of Computers, IEEE,Volume 15, Issue 2, April-June 1998 , Page(s) 56 - 64
    Keywords: built-in self test
    design for testability
    Abstract: © 1998 Institute of Electrical and Electronics Engineers - No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. This paper provides an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy
    URI: http://www.ieee.org/
    Appears in Collections:[電機資訊學院學士班] 期刊論文

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