English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14177467      Online Users : 61
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42007

    Title: Easily testable iterative logic arrays
    Authors: Chen-Wen Wu;Cappello, P.R.
    教師: 吳誠文
    Date: 1990
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Computers, IEEE Transactions , Volume 39, Issue 5, May 1990 , Page(s) 640 - 652
    Keywords: cellular arrays
    combinatorial circuits
    logic testing
    Abstract: © 1990 Institute of Electrical and Electronics Engineers - Iterative logic arrays (ILAs) are studied with respect to two testing problems. First, a variety of conditions is presented. Meeting these conditions guarantees an upper bound on the size of the test set for the ILA under consideration. Second, techniques for designing optimally testable ILAs are presented. The arrays treated are, in some cases, more general than those that have been reported by other researchers: they include multidimensional and inhomogeneous arrays. Octagonally connected arrays and bilateral arrays are also discussed. The results indicate that the characteristics of the individual cell functions (e.g. whether they are bijective) are a good guide to the test complexity of the overall array. Matrix multiplication, as an example, is shown to have several different optimally testable implementations. The results are useful for combinational and pipelined arrays and for certain systolic arrays
    URI: http://www.ieee.org/
    Appears in Collections:[電機資訊學院學士班] 期刊論文

    Files in This Item:

    File SizeFormat


    SFX Query


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback