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    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42007


    Title: Easily testable iterative logic arrays
    Authors: Chen-Wen Wu;Cappello, P.R.
    教師: 吳誠文
    Date: 1990
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Computers, IEEE Transactions , Volume 39, Issue 5, May 1990 , Page(s) 640 - 652
    Keywords: cellular arrays
    combinatorial circuits
    logic testing
    Abstract: © 1990 Institute of Electrical and Electronics Engineers - Iterative logic arrays (ILAs) are studied with respect to two testing problems. First, a variety of conditions is presented. Meeting these conditions guarantees an upper bound on the size of the test set for the ILA under consideration. Second, techniques for designing optimally testable ILAs are presented. The arrays treated are, in some cases, more general than those that have been reported by other researchers: they include multidimensional and inhomogeneous arrays. Octagonally connected arrays and bilateral arrays are also discussed. The results indicate that the characteristics of the individual cell functions (e.g. whether they are bijective) are a good guide to the test complexity of the overall array. Matrix multiplication, as an example, is shown to have several different optimally testable implementations. The results are useful for combinational and pipelined arrays and for certain systolic arrays
    URI: http://www.ieee.org/
    http://nthur.lib.nthu.edu.tw/handle/987654321/42007
    Appears in Collections:[電機資訊學院學士班] 期刊論文

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