National Tsing Hua University Institutional Repository:Economic aspects of memory built-in self-repair
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 54367/62174 (87%)
造访人次 : 13878484      在线人数 : 57
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42009


    题名: Economic aspects of memory built-in self-repair
    作者: Huang, Rei-Fu;Chen, Chao-Hsun;Wu, Cheng-Wen
    教師: 吳誠文
    日期: 2007
    出版者: Institute of Electrical and Electronics Engineers
    關聯: Design & Test of Computers, IEEE, Volume 24, Issue 2, March-April 2007 , Page(s) 164 - 172
    关键词: Data storage equipment
    Built-in self test
    Computer simulation
    Cost effectiveness
    Industrial economics
    摘要: © 2007 Institute of Electrical and Electronics Engineers - The demand for built-in self-repair (BISR) methodologies that improve the yield of embedded memories is growing. A typical BISR scheme requires circuit modules that perform built-in self-test (BIST), built-in redundancy analysis (BIRA), real-time address remapping, and so on. The objective of BISR design is to maximize the final yield while keeping a reasonably low hardware overhead. In this work, the authors propose cost and benefit models, and evaluate the economic effectiveness of typical memory BISR implementations. They also present a simulator for that purpose based on the proposed cost models. The results are useful for evaluating the BISR schemes and implementations. Experimental results show that memory size impacts the cost-effectiveness of BISR more than production volume does.
    URI: http://www.ieee.org/
    http://nthur.lib.nthu.edu.tw/handle/987654321/42009
    显示于类别:[電機資訊學院學士班] 期刊論文

    文件中的档案:

    档案 大小格式浏览次数
    0KbUnknown1582检视/开启


    在NTHUR中所有的資料項目都受到原著作權保護,僅提供學術研究及教育使用,敬請尊重著作權人之權益。若須利用於商業或營利,請先取得著作權人授權。
    若發現本網站收錄之內容有侵害著作權人權益之情事,請權利人通知本網站管理者(smluo@lib.nthu.edu.tw),管理者將立即採取移除該內容等補救措施。

    SFX Query

    與系統管理員聯絡

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈