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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機資訊學院學士班 > 期刊論文 >  Efficient double fault diagnosis for CMOS logic circuits with a specific application to generic bridging faults


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42016


    Title: Efficient double fault diagnosis for CMOS logic circuits with a specific application to generic bridging faults
    Authors: Kao, Hong-Chou;Tsai, Ming-Fu;Huang, Shi-Yu;Wu, Cheng-Wen;Chang, Wen-Feng;Lu, Shyue-Kung
    教師: 吳誠文
    Date: 2003
    Publisher: Institute of Information Science Academia Sinica
    Relation: Journal of Information Science and Engineering, Volume 19, Number 4, July 2003, p571-587
    Keywords: VLSI testing
    fault diagnosis
    logic diagnosis
    fault model
    fault simulation
    Abstract: © 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts the most likely fault sites in a faulty chip is an important step for manufacturing yield improvement or design debugging. In this paper, we address the problem of double fault diagnosis for full-scan designs. Our algorithm aims to identify both faults accurately. The features of our algorithm include the following. (1) The proposed algorithm is not limited to any particular fault type. (2) An effective selection heuristic is incorporated to significantly reduce the diagnosis time, while retaining a high success rate of catching faults. (3) The inject-and-evaluate paradigm proposed in [6] is incorporated to accurately screen out unlikely fault candidates. Experimental results on ISCAS85 benchmark circuits injected with a generic bridging fault, two stuck-at faults, or two gate-type faults show that both faults can be caught simultaneously within several minutes with a high success rate.
    URI: Journal of Information Science and Engineering, Volume 19, Number 4, July 2003, p571-587
    http://www.iis.sinica.edu.tw/
    http://nthur.lib.nthu.edu.tw/handle/987654321/42016
    Appears in Collections:[電機資訊學院學士班] 期刊論文

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