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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機資訊學院學士班 > 期刊論文 >  Testing and diagnosis methodologies for embedded content addressable memories


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42024


    Title: Testing and diagnosis methodologies for embedded content addressable memories
    Authors: Li, Jin-Fu;Tzeng, Ruey-Shing;Wu, Cheng-Wen
    教師: 吳誠文
    Date: 2003
    Publisher: Springer Verlag
    Relation: Journal of Electronic Testing , Volume 19 , pages 207-215 , March 2003
    Keywords: Electronic equipment testing
    Embedded systems
    Algorithms
    Random access storage
    Requirements engineering
    Abstract: © 2003 Springer Verlag - Embedded content addressable memories (CAMs) are important components in many system chips where most CAMs are customized and have wide words. This poses challenges on testing and diagnosis. In this paper two efficient March-like test algorithms are proposed first. In addition to typical RAM faults, they also cover CAM-specific comparison faults. The first algorithm requires 9N Read/Write operations and 2(N + W) Compare operations to cover comparison and RAM faults (but does not fully cover the intra-word coupling faults), for an N × W-bit CAM. The second algorithm uses 3N log2 W Write and 2W log2 W Compare operations to cover the remaining intra-word coupling faults. Compared with the previous algorithms, the proposed algorithms have higher fault coverage and lower time complexity. Moreover, it can test the CAM even when its comparison result is observed only by the Hit output or the priority encoder output. We also present the algorithms that can locate the cells with comparison faults. Finally, a CAM BIST design is briefly described.
    URI: http://www.springerlink.com/
    http://nthur.lib.nthu.edu.tw/handle/987654321/42024
    Appears in Collections:[電機資訊學院學士班] 期刊論文

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