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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機資訊學院學士班 > 期刊論文 >  Easily Testable and Fault-Tolerant FFT Butterfly Networks


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/42026


    Title: Easily Testable and Fault-Tolerant FFT Butterfly Networks
    Authors: J.-F. Li;S.-K. Lu;S.-A. Hwang;C.-W. Wu
    教師: 吳誠文
    Date: 2000
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 47, NO. 9, SEPTEMBER 2000
    Keywords: Butterfly network
    C-testable
    concurrent error detection
    design-for-testability
    fault tolerance
    FFT
    logic testing
    Abstract: © 2000 Institute of Electrical and Electronics Engineers - With the advent of deep submicron very large scale integration technology, the integration of a large fast-Fourier-transform (FFT) network into a single chip is becoming possible. However, a practical FFT chip is normally very big, so effective testing and fault-tolerance techniques usually are required. In this paper, we first propose a C-testable FFT network design. Only 20 test patterns are required to cover all combinational single-cell faults and interconnect stuck-at and break faults for the FFT network, regardless of its size. A spare-row based fault-tolerant FFT network design is subsequently proposed. Compared with previous works, our approach shows higher reliability and lower hardware overhead, and only three bit-level cell types are needed for repairing a faulty row in the multiply–subtract–add module. Also, special cell design is not required to implement the reconfiguration scheme. The hardware overhead for the testable design is low—about 4% for 16-bit numbers, regardless of the FFT network size.
    URI: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: ANALOG AND DIGITAL SIGNAL PROCESSING, VOL. 47, NO. 9, SEPTEMBER 2000
    http://nthur.lib.nthu.edu.tw/handle/987654321/42026
    Appears in Collections:[電機資訊學院學士班] 期刊論文

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