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    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/46418


    Title: Segmented WIP Control for Cycle Time Reduction
    Authors: Chen-Fu Chien;Chih-Han Hu
    教師: 簡禎富
    Date: 2006
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Thirteenth International Symposium on Semiconductor Manufacturing, ISSM 2006, Tokyo, Japan, 25-27 Sept. 2006, Pages 265-268
    Keywords: production control
    semiconductor device manufacture
    segmented WIP control
    cycle time reduction
    heavily loaded production routes
    starvation avoidance method
    capacity constrained resources
    Abstract: In semiconductor manufacturing, it is difficult for engineers to control complicated and often imbanlanced heavily loaded production routes well. This study aims to propose a framework of segmented WIP control for the production routes to control and reduce cycle time effectively. Furthermore, Starvation Avoidance (SA) method is employed to maintain high utilization of the Capacity Constrained Resources (CCR) in light of low WIP situations. A simulation is designed and validated with a small-scale model based on real data collected in a wafer fab in Taiwan. The results demonstrated its qualified viability.
    URI: http://www.ieee.org/
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/46418
    Appears in Collections:[工業工程與工程管理學系] 會議論文

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