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    National Tsing Hua University Institutional Repository > 工學院  > 工業工程與工程管理學系 > 會議論文  >  Analyzing Alternative Strategies of Semiconductor Final Testing


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/46430


    Title: Analyzing Alternative Strategies of Semiconductor Final Testing
    Authors: Hung-Ju Wang;Chen-Fu Chien;Chung-Jen Kuo
    教師: 簡禎富
    Date: 2002
    Publisher: Springer Verlag
    Relation: the Fifth International Conference on Multi-Objective Programming and Goal Programming, Nara, Japan, 2002, Pages 409-414
    Keywords: Decision Analysis
    Semiconductor Manufacturing
    Final Test
    Abstract: This study integrates cost management and statistical decision analysis to construct a decision framework to determine an optimal alternative that balances multiple objectives of efficiency, cost, and risk. The framework was implemented in a testing firm and the experimental results showed its practical viability.
    URI: http://www.springerlink.com/
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/46430
    Appears in Collections:[工業工程與工程管理學系] 會議論文

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