National Tsing Hua University Institutional Repository:In-situ study of SAMs growth process by cross analysis of AFM height and lateral deflection
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 54367/62174 (87%)
造访人次 : 14792027      在线人数 : 108
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻
    National Tsing Hua University Institutional Repository > 原子科學院  > 工程與系統科學系 > 會議論文  >  In-situ study of SAMs growth process by cross analysis of AFM height and lateral deflection


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/47201


    题名: In-situ study of SAMs growth process by cross analysis of AFM height and lateral deflection
    作者: Chun-Lung Wu;Fan-Gang Tseng;Ching-Chang Chieng
    教師: 錢景常
    日期: 2005
    出版者: Nano Science and Technology Institute
    關聯: 2005 NSTI Nanotechnology Conference and Trade Show. NSTI Nanotech 2005, 2005, p 408-11
    关键词: atomic force microscopy
    monolayers
    organic compounds
    self-assembly
    摘要: This paper introduces a novel way to investigate SAMs growth process by cross analysis of the information of AFM height and lateral deflection scanning results. The traditional ways by analysis of AFM height and histogram data can not differentiate the molecular growth detail behavior of alkylsinae SAMs because the images captured by AFM are static and lack molecular level information. Thus, this paper proposes to employ the standard deviation of AFM data to analyze the in-situ growth behaviors of alkylsinae SAMs in comparison with the local height and lateral deflection data. The analysis results demonstrated close correlation of the SAMs growth process among the aforementioned data analysis methods
    URI: http://www.nsti.org/procs/Nanotech2005v2/5/W913.09
    http://www.nsti.org/
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/47201
    显示于类别:[工程與系統科學系] 會議論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbHTML680检视/开启


    在NTHUR中所有的資料項目都受到原著作權保護,僅提供學術研究及教育使用,敬請尊重著作權人之權益。若須利用於商業或營利,請先取得著作權人授權。
    若發現本網站收錄之內容有侵害著作權人權益之情事,請權利人通知本網站管理者(smluo@lib.nthu.edu.tw),管理者將立即採取移除該內容等補救措施。

    SFX Query

    與系統管理員聯絡

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈