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    National Tsing Hua University Institutional Repository > 原子科學院  > 工程與系統科學系 > 期刊論文 >  Dark-field image of full-field transmission hard x-ray microscope in 8-11 keV

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/47964

    Title: Dark-field image of full-field transmission hard x-ray microscope in 8-11 keV
    Authors: G. C. Yin;F. Duewer;X. Zeng;A. Lyon;W. Yun;F. R. Chen;K. S. Liang
    教師: 陳福榮
    Date: 2006
    Publisher: Society of Photo-optical Instrumentation Engineers
    Relation: Proceedings of the SPIE - The International Society for Optical Engineering, v 6317, 631703-1-8, 2006
    Keywords: imaging
    hard X-ray microscope
    Abstract: We have demonstrated dark-field imaging using a full-field hard x-ray microscope by using a custom capillary-based condenser. The condenser provides illumination with a numeric aperture about 3-mrad with high efficiency. This high illumination angle allows full-resolution imaging using a 50 nm hard x-ray zone plate. The zeroth order beam from the condenser is well out of the zoneplate range - which allows a high signal-to-noise ratio in the image plane. Small particles with high scattering power, such as colloidal gold markers used in biology are well-suited for dark-field imaging. Combining with high brightness source from NSRRC BL01B, the dark field image can be acquired within several minutes with high contrast ratio. In this paper, the dark field image of IC and the zoneplate defect will be demonstrated and studied in different energy under dark field mode.
    URI: http://spie.org/
    Appears in Collections:[工程與系統科學系] 期刊論文

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