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    National Tsing Hua University Institutional Repository > 工學院  > 材料科學工程學系 > 期刊論文 >  Thickness-dependent retention behaviors and ferroelectric properties of BiFeO3 thin films on BaPbO3 electrodes

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/52425

    Title: Thickness-dependent retention behaviors and ferroelectric properties of BiFeO3 thin films on BaPbO3 electrodes
    Authors: Chia-Ching Lee;Jenn-Ming Wu
    教師: 吳振名
    Date: 2007
    Publisher: American Institute of Physics
    Relation: Applied Physics Letters,Browse,Volume 91,Issue 10,DIELECTRICS AND FERROELECTRICITY
    Keywords: barium compounds
    bismuth compounds
    dielectric hysteresis
    dielectric polarisation
    ferroelectric thin films
    sputter deposition
    Abstract: BiFeO3 (BFO) thin films produced with varied film thicknesses ranging from 100 to 230 nm were fabricated on BaPbO3(BPO)/Pt/Ti/SiOx/Si substrates by rf-magnetron sputtering. Saturated polarization-electrical field hysteresis loops, polarization response by pulse measurement, and retention properties were obtained for BFO films with various thicknesses on BPO. The retention behaviors of BFO demonstrate logarithmic time dependence and stretched exponential law. When the thicknesses of BFO films increase, the contribution of logarithmic time dependence to retention, the stretched exponential law becomes dominant. BFO films with thinner thickness exhibit better retention properties but possess smaller remnant polarization.
    URI: http://www.aip.org/
    Appears in Collections:[材料科學工程學系] 期刊論文

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