English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 15214999      Online Users : 118
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 工學院  > 材料科學工程學系 > 期刊論文 >  Dielectric properties of metal-organic chemical vapor deposited highly textured Pb(ScTa)1–xTixO3 (x = 0–0.3) relaxor ferroelectric thin films on LaNiO3 electrode buffered Si


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/52560


    Title: Dielectric properties of metal-organic chemical vapor deposited highly textured Pb(ScTa)1–xTixO3 (x = 0–0.3) relaxor ferroelectric thin films on LaNiO3 electrode buffered Si
    Authors: C. H. Lin;S. W. Lee;Haydn Chen;T. B. Wu
    教師: 吳泰伯
    Date: 1999
    Publisher: American Institute of Physics
    Relation: Appl. Phys. Lett., Vol. 75, pp. 2485-2487.
    Keywords: semiconductor-insulator boundaries
    amorphous state
    Fermi level
    transmission electron microscopy
    X-ray photoelectron spectra
    interface structure
    electronic density of states
    interface states
    current density
    leakage currents
    passivation
    atomic layer deposition
    III-V semiconductors
    indium compounds
    gallium arsenide
    aluminium compounds
    Abstract: Highly (100) textured Pb(ScTa)1–xTixO3 (x = 0–0.3) thin films were grown on LaNiO3/Pt/Ti electrode-coated Si substrate using metal-organic chemical vapor deposition at 685 °C. Ti addition was introduced to modify the dielectric properties. Diffuse phase transition, typical of relaxor ferroelectrics was noticed. As Ti content increased from 0 to 30, the phase transition temperature (Tmax) gradually shifted from –10 to 120 °C with the dielectric constant at Tmax increased from 1397 to 1992 (1 kHz). Loss tangent values are generally below 0.025.
    URI: http://www.aip.org/
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/52560
    Appears in Collections:[材料科學工程學系] 期刊論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML534View/Open


    在NTHUR中所有的資料項目都受到原著作權保護,僅提供學術研究及教育使用,敬請尊重著作權人之權益。若須利用於商業或營利,請先取得著作權人授權。
    若發現本網站收錄之內容有侵害著作權人權益之情事,請權利人通知本網站管理者(smluo@lib.nthu.edu.tw),管理者將立即採取移除該內容等補救措施。

    SFX Query

    與系統管理員聯絡

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback