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    National Tsing Hua University Institutional Repository > 工學院  > 材料科學工程學系 > 期刊論文 >  Development of temperature-stable thick-film dielectrics. III. Roleof glass on the microstructure evolution of a thick-film dielectric

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/52884

    Title: Development of temperature-stable thick-film dielectrics. III. Roleof glass on the microstructure evolution of a thick-film dielectric
    Authors: Chiou Bi-Shiou;Liu, K.C.;Duh Jenq-Gong;Chung, M.C.
    教師: 杜正恭
    Date: 1991
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: IEEE Transactions on , Volume 14, Issue 3, pp.645 - 649
    Keywords: ageing
    barium compounds
    dielectric materials
    environmental testing
    materials testing
    strontium compounds
    thick film circuits
    Abstract: For pt.I see ibid., vol.12, p.798-808 (1989). Glass phase plays an important role in the characteristics of thick-film microelectronics. A dielectric system in BaTiO3 and SrTiO3 containing PbO, B2O3, SiO2, and Al2O 3 glass constituents is investigated. Microstructure evolution and phase distribution after thermal aging are studied with the aid of electron microscope and X-ray diffractometer. It is observed that the phases in 40 vol.% BaTiO3-25 vol.% SrTiO3-35 vol.% glass thick-film dielectric are not altered after 500°C aging for 480 h. The variation in surface morphology after aging is attributed to the precipitation of heavy metal component from the glass which acts as a diffusion species and then dissolves the crystalline phase during firing. The presence of glass in the dielectric enhances the formation of solid solution (BaxSr1-x)TiO3 and results in the broadening of the Curie peak
    URI: http://www.ieee.org/
    Appears in Collections:[材料科學工程學系] 期刊論文

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