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    National Tsing Hua University Institutional Repository > 理學院 > 物理系 > 期刊論文 >  Microwave penetration depth measurement for high Tcsuperconductors by dielectric resonators

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/54940

    Title: Microwave penetration depth measurement for high Tcsuperconductors by dielectric resonators
    Authors: Hang-Ting Lue;Juh-Tzeng Lue;Tseung-Yuen Tseng
    教師: 呂助增
    Date: 2002
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Instrumentation and Measurement, IEEE Transactions on, Institute of Electrical and Electronics Engineers, Volume 51, Issue 3, Jun 2002, Pages 433 - 439
    Keywords: barium compounds
    dielectric resonators
    high-temperature superconductors
    microwave measurement
    penetration depth (superconductivity)
    superconducting thin films
    yttrium compounds
    Abstract: The penetration depth λ(T) dependence on temperatures for high Tc superconducting YBa2Cu3O7-δ thin films stored in various environments was measured by a well-designed microwave dielectric resonator. A d-wave T2 dependence was observed at low temperatures, while an exponential dependence of the penetration depth λ(T) relevant to the s wave was detected as temperature increases due to thermal fluctuation. An abnormal upturn of the penetration depth at temperatures below 10 K attributed to the surface current carried by the defect surface-induced Andreev bound states can be apparently observed without applying heavy-ion bombardment from this relatively higher frequency measurement. Readers who endeavor to start this kind of measurement can use the well-modified dielectric cavity in conjunction with the detailed measuring procedure
    URI: http://www.ieee.org/
    Appears in Collections:[物理系] 期刊論文

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