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    National Tsing Hua University Institutional Repository > 理學院 > 物理系 > 期刊論文 >  Liquid crystal alignment on plasma beam scanned alkylsiloxane self-assembled monolayers


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/55443


    Title: Liquid crystal alignment on plasma beam scanned alkylsiloxane self-assembled monolayers
    Authors: Wu, K.Y.;Chen, W.Y.;Wang, C.-H.;Hwang, J.;Lee, C.-Y.;Liu, Y.-L.;Huang, H.Y.;Wei, H.K.;Kou, C.S.
    教師: 寇崇善
    Date: 2008
    Publisher: Electrochemical Society
    Relation: Journal of the Electrochemical Society, Electrochemical Society, Volume 155, Issue 9, Sept. 2008, Pages J244-J247
    Keywords: carbon
    hydrogenation
    liquid crystals
    molecular orientation
    monolayers
    self-assembly
    surface roughness
    Abstract: The octadecyl–trimethoxysiloxane self-assembled monolayers (SAMs) exhibit better uniformity and smoothness on hydrogenated amorphous carbon (a-C:H) films than on indium tin oxide glasses. The liquid crystal alignment on the SAM/a-C:H can be greatly improved by Ar plasma beam scanning. The pretilt angle increases abruptly with Ar plasma beam scanning time within 5 s and reaches a maximum value of about 5° at a longer scanning time. The surface roughness of SAM slightly increases from 0.10 to 0.13 nm after Ar plasma beam scanning. This implies that bond breaking occurs on the SAM surface during the plasma beam scanning. Fourier transform infrared spectrometer and X-ray photoemission spectroscope data indicate that plasma beam scanning can sputter off the CH2 bonds in the alkyl chain of SAM. The amount of oxygen on the SAM surface increases after plasma beam scanning and the increase of oxygen is attributed to the formation of C–O bonds during air exposure after plasma beam scanning.
    URI: http://www.electrochem.org/
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/55443
    Appears in Collections:[物理系] 期刊論文

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