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    National Tsing Hua University Institutional Repository > 理學院 > 物理系 > 期刊論文 >  Direct Determination of X-Ray Reflection Phases


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/55533


    Title: Direct Determination of X-Ray Reflection Phases
    Authors: Shih-Lin Chang
    教師: 張石麟
    Date: 1982
    Publisher: American Physical Society
    Relation: PHYSICAL REVIEW LETTERS, American Physical Society, Volume 48, Issue 3, 1982, Pages 163-166
    Keywords: X-Ray
    Abstract: A practical method is described for the phase determination of x-ray reflections from single crystals. Considerations on the dynamical interaction in multiple diffraction and on the relative rotation of the crystal lattice with respect to the Ewald sphere reveal both experimentally and theoretically the phase dependence of the reflected intensity. Applications can be made for a direct experimental determination of phases without carrying out the complicated dynamical calculation.
    URI: http://www.aps.org/
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/55533
    Appears in Collections:[物理系] 期刊論文

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