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    National Tsing Hua University Institutional Repository > 原子科學院  > 生醫工程與環境科學系 > 期刊論文 >  The determination of silicon in airborne particulate matter by XRF and LA-ICP-MS


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/61818


    Title: The determination of silicon in airborne particulate matter by XRF and LA-ICP-MS
    Authors: Wang CF;Tu FH;Jeng SL;Chin CJ
    教師: 王竹方
    Date: 1999
    Publisher: Springer Verlag
    Relation: Journal of Radioanalytical and Nuclear Chemistry, Volume 242, Number 1, 97-103
    Keywords: silicon
    airborne
    XRF
    LA-ICP-MS
    Abstract: This study reports the analysis of Si in airborne particulate matter by laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) as well as X-ray fluorescence (XRF). It was found that Si concentration in airborne particulates collected on PTFE-membrane filters could be accurately determined with a laser beam operated at 160 mJ free running mode, 6.5 mm defocusing distance and 0.8 1/min carrier gas flow rate during the LA-ICP-MS measurement. Standard filters prepared by NIST SRM 1648 urban particulates were used for both XRF and LA-ICP-MS not only to establish the calibration curves of Si, but also to examine the proposed method's effectiveness. The capability of applying both methods for natural sample analysis was also examined. Particulate loaded filter samples collected from a heavily polluted metropolitan area of Kaoshiung, Taiwan were initially measured by XRF, then by LA-ICP-MS. An intercomparison between them was thus performed. As a result, both XRF and LA-ICP-MS proved to be the valid analytical methods for directly determining Si concentrations in airborne particulates on PTFE membrane filters.
    URI: http://www.springer.com
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/61818
    Appears in Collections:[生醫工程與環境科學系] 期刊論文

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