English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 15219799      Online Users : 65
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  A 0.7-V CMOS Operational Transconductance Amplifier with Bulk-Driven Technique

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/69659

    Title: A 0.7-V CMOS Operational Transconductance Amplifier with Bulk-Driven Technique
    Authors: M.-H. Shen;Y.-S. Wu;G.-H. Ke;P.-C. Huang
    教師: 黃柏鈞
    Date: 2010
    Publisher: Institute of Electrical and Electronics Engineers (IEEE)
    Relation: SoC Design Conference (ISOCC), 2010 International, Seoul, 22-23 Nov. 2010, Pages 392 - 395
    Keywords: CMOS
    Operational Transconductance Amplifier
    Abstract: This paper presents a two-stage pseudo-differential amplifier. Rail-to-rail operations are achieved by using bulk terminals as the inputs. The positive feedback technique is used to enhance the transconductance with negative conductance. The bulk terminals of all transistors are carefully biased to lower their threshold voltages (Vth) and maximize signal swing. Using a standard 0.18-μm CMOS technology, measurement results demonstrate that gain-bandwidth product is 0.97MHz. The settling time for a 0.7-Vpp step is 2.1/μS. The input referred noise is 0.14mV at 1MHz. All the circuits dissipate 0.107μW under a single 0.7-V power supply.
    Relation Link: http://www.ieee.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/69659
    Appears in Collections:[電機工程學系] 會議論文

    Files in This Item:

    File Description SizeFormat


    SFX Query


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback