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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Diffusivity of Si in the 3CSiC Buffer Layer on Si(100) by X-ray Photoelectron Spectroscopy


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/69958


    Title: Diffusivity of Si in the 3CSiC Buffer Layer on Si(100) by X-ray Photoelectron Spectroscopy
    Authors: Wei-Yu Chen;Jian-You Lin;Jenn-Chang Hwang;Chih-Fang Huang
    教師: 黃智方
    Date: 2010
    Publisher: Materials Research Society
    Relation: 2010 MRS Spring Meeting, San Francisco, CA, April 5-9, 2010
    Keywords: 3CSiC
    X-ray
    Photoelectron
    Spectroscopy
    Relation Link: http://www.mrs.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/69958
    Appears in Collections:[電機工程學系] 會議論文

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