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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Handling pattern-dependent delay faults in diagnosis

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/70275

    Title: Handling pattern-dependent delay faults in diagnosis
    Authors: Jyun-Wei Chen;Ying-Yen Chen;Jing-Jia Liou
    教師: 劉靖家
    Date: 2007
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: VLSI Test Symposium, 2007, 25th IEEE, 6-10 May 2007, Pages 151 - 157
    Keywords: diagnosis
    Abstract: Traditionally, diagnosis methods use static models for delay defects, while there exists a class of faults including cross-coupling capacitance and resistive shorts exhibiting different effects on path delays with different input patterns. Blindly treating such faults will lead to skewed results for locating defects. In this paper, the authors discuss the method to handle these faults without explicitly modeling each type of faults. In the process, the authors differentiate failed delay paths into two categories: static and pattern-dependent. The authors further explore these information to list possible candidates (including coupling defects) causing timing failures for further analysis. The experimental results show that average rankings of suspects are 2.1 and 4.6 for failing segments and coupling pairs, respectively.
    Relation Link: http://www.ieee.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/70275
    Appears in Collections:[電機工程學系] 會議論文

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