English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14185651      Online Users : 86
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 期刊論文 >  Comment on“Dephasing of conduction electrons due to zero-point fluctuation”

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/71670

    Title: Comment on“Dephasing of conduction electrons due to zero-point fluctuation”
    Authors: Wu, G.Y.;Lin, J.J.
    教師: 吳玉書
    Date: 2001
    Publisher: American Physical Society
    Relation: Physical Review B (Condensed Matter and Materials Physics), American Physical Society, Volume 64,   Issue 11, 15 Sept. 2001, Pages 117301/1-2
    Keywords: dephasing
    conduction electrons
    zero-point fluctuation
    electromagnetic field
    electron dephasing time
    Aharonov-Bohm phase
    Abstract: It is recently proposed by Wang et al. [Phys. Rev. B 61, R5090 (2000)] that dephasing of conduction electrons due to zero-point fluctuation of electromagnetic field in a vacuum can well account for the measured saturation of electron dephasing time at T→0 in various materials. We point out that this calculation is numerically incorrect, while we also provide arguments showing that zero-point fluctuation of electromagnetic field does not cause any dephasing within this theory of Wang et al.
    Relation Link: http://www.aps.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/71670
    Appears in Collections:[電機工程學系] 期刊論文

    Files in This Item:

    File Description SizeFormat
    2030120010035.pdf20KbAdobe PDF108View/Open


    SFX Query


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback