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    National Tsing Hua University Institutional Repository > 理學院 > 物理系 > 期刊論文 >  Intracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diode


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/82196


    Title: Intracavity measurement of liquid crystal layer thickness by wavelength tuning of an external cavity laser diode
    Authors: Yu-Ping Lan;Yea-Feng Lin;Yu-Tai Li;Ru-Pin Pan;Chao-Kuei Lee;Ci-Ling Pan
    教師: 潘犀靈
    Date: 2005
    Publisher: Optical Society of America
    Relation: Optics Express, v 13, n 20, p 7905-7912, October 3, 2005
    Keywords: CELL-GAP MEASUREMENT
    INTERFEROMETRIC METHODS
    DISPLAYS
    DISTRIBUTIONS
    PARAMETERS
    SURFACE
    Abstract: The gap of a planar-aligned liquid crystal (LC) cell is measured by a novel method: Monitoring the change in output wavelength of an external-cavity diode laser by varying the voltage driving the LC cell placed in the laser cavity. This method is particularly suitable for measurement of LC cells of small phase retardation. Measurement errors of +/- 0.5 % and +/- 0.6 % for 9.6-mu m and 4.25-mu m cells with phase retardations of 1.63 mu m and 0.20 mu m respectively are demonstrated.
    URI: http://www.osa.org/
    http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/82196
    Appears in Collections:[物理系] 期刊論文

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