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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 資訊工程學系 > 期刊論文 >  Design and Analysis of Cost-Cognizant Test Case Prioritization Using Genetic Algorithm with Test History

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/82440

    Title: Design and Analysis of Cost-Cognizant Test Case Prioritization Using Genetic Algorithm with Test History
    Authors: Y. C. Huang;C. Y. Huang;J. R. Chang;T. Y. Chen
    教師: 黃慶育
    Date: 2010
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Proceedings of the 34th Annual IEEE International Computer Software and Applications Conference (COMPSAC 2010), Seoul, South Korea, 19-23 July 2010, pp. 413-418
    Keywords: Average Percentage of Faults Detected pre Cost(APFDc)
    cost-cognizant test case prioritizaion
    fault severity
    rate of fault detection
    regression testing
    test cost
    Abstract: During software development, regression testing is usually used to assure the quality of modified software. The techniques of test case prioritization schedule the test cases for regression testing in an order that attempts to increase the effectiveness in accordance with some performance goal. The most general goal is the rate of fault detection. It assumes all test case costs and fault severities are uniform. However, those factors usually vary. In order to produce a more satisfactory order, the cost-cognizant metric that incorporates varying test case costs and fault severities is proposed. In this paper, we propose a cost-cognizant test case prioritization technique based on the use of historical records and a genetic algorithm. We run a controlled experiment to evaluate the proposed technique's effectiveness. Experimental results indicate that our proposed technique frequently yields a higher Average Percentage of Faults Detected per Cost (APFDc). The results also show that our proposed technique is also useful in terms of APFDc when all test case costs and fault severities are uniform.
    Relation Link: http://www.ieee.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/82440
    Appears in Collections:[資訊工程學系] 期刊論文
    [資訊系統與應用研究所] 會議論文

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