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    National Tsing Hua University Institutional Repository > 電機資訊學院 > 資訊工程學系 > 期刊論文 >  A Study of Using Two-Parameter Generalized Pareto Model to Analyze the Fault Distribution of Open Source Software

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/82447

    Title: A Study of Using Two-Parameter Generalized Pareto Model to Analyze the Fault Distribution of Open Source Software
    Authors: C. S. Kuo;C. Y. Huang;S. P. Luan
    教師: 黃慶育
    Date: 2012
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: Proceedings of the 6th IEEE International Conference on Software Security and Reliability (SERE 2012), Maryland, USA, 20-22 June 2012, pp. 88 - 97
    Keywords: Open Source Software
    Pareto principle
    Software testing
    Weibull model
    fault distribution
    Abstract: In the modern society, software plays a very important part in many security-critical or mission-critical systems. Consequently, the main goal of project managers and software engineers is to develop and deliver reliable software within very limited resource, time, and budget. In the past, some research reports showed that the Weibull distribution (WD) and the Pareto distribution (PD) models can be used to describe the distribution of software faults. In this paper, based on our previous study, we further propose and show how the two-parameter generalized Pareto distribution (2-GPD) can be used to model the distribution of software faults. Some mathematical properties of proposed model are analyzed and presented. Experiments based on open source software (OSS) are performed and discussed in detail. Evaluation results show that the proposed 2-GPD model eliminates some issues in modeling that arise in the PD model and has a fairly accurate prediction capability of fault distributions of OSS and depicts the real-life situation more faithfully.
    Relation Link: http://www.ieee.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/82447
    Appears in Collections:[資訊工程學系] 期刊論文
    [資訊系統與應用研究所] 會議論文

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