English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 10057987      Online Users : 122
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Cost modeling and analysis for interposer-based three-dimensional IC


    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/83921


    Title: Cost modeling and analysis for interposer-based three-dimensional IC
    Authors: Y.-W. Chou;P.-Y. Chen;M. Lee;C.-W. Wu
    教師: 吳誠文
    Date: 2011
    Publisher: Institute of Electrical and Electronics Engineers
    Relation: 30th IEEE VLSI Test Symposium (VTS), HI, APR 23-25, 2012
    Keywords: LEVEL
    Abstract: Three-dimensional (3D) integration has recently become a popular technology for integrated circuits (IC). 3D IC with the passive silicon interposer is currently the main trend in the industry, especially for processor-memory integration. Evaluating the economic efficiency of test operations in the interposer-based 3D IC thus is important. We propose a cost model for the Die-to-Wafer (D2W) and Die-to-Die (D2D) stacking, including manufacturing cost and test cost. A tool which is based on the proposed cost model is developed. We use this tool for cost analysis and for finding the most cost effective test flow. The results show that, in some applications, test flows including the iterative known-good stack (KGS) test and the pre-bond interposer test significantly reduce the cost, when the KGS test yield is lower than 98.2% and the pre-bond interposer test yield is lower than 99.38%. A Shmoo plot is depicted to show the lower bound of the yield of the final package level test, given the number of stacked dies and the final yield. For different applications, the proposed model evaluates the critical yield or cost values, which helps the designers to determine the most cost effective test flow and the system architecture.
    Relation Link: http://www.ieee.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/83921
    Appears in Collections:[電機工程學系] 會議論文
    [電腦與通訊科技研發中心] 會議論文
    [資訊工程學系] 會議論文

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML525View/Open


    在NTHUR中所有的資料項目都受到原著作權保護,僅提供學術研究及教育使用,敬請尊重著作權人之權益。若須利用於商業或營利,請先取得著作權人授權。
    若發現本網站收錄之內容有侵害著作權人權益之情事,請權利人通知本網站管理者(smluo@lib.nthu.edu.tw),管理者將立即採取移除該內容等補救措施。

    SFX Query

    與系統管理員聯絡

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback