English  |  正體中文  |  简体中文  |  Items with full text/Total items : 54367/62174 (87%)
Visitors : 14662367      Online Users : 67
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTHU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    National Tsing Hua University Institutional Repository > 電機資訊學院 > 電機工程學系 > 會議論文  >  Length dependence of forward and backward THz difference frequency generation in a strongly absorptive material

    Please use this identifier to cite or link to this item: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/83985

    Title: Length dependence of forward and backward THz difference frequency generation in a strongly absorptive material
    Authors: Y. C. Huang;M. Y. Chuang;Y. H. Lin;C. H. Lee;T. D. Wang;Y. Y. Lin;F. Y. Lin
    教師: 林凡異
    Date: 2011
    Publisher: International Society for Optical Engineering
    Relation: SPIE Photonic West, San Francisco, USA, Jan. 22-27, 2011
    Keywords: difference frequency generation
    THz wave
    lithium niobate
    Abstract: Some believes that the useful length of THz different frequency generation (DFG) in a highly absorptive material is comparable to the absorption length of the THz wave. We show in theory and experiment that it is only true for backward THz DFG. For forward DFG with strong idler absorption, the THz wave can continue to grow with the length of a DFG crystal.

    © (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
    Relation Link: http://spie.org/
    URI: http://nthur.lib.nthu.edu.tw/dspace/handle/987654321/83985
    Appears in Collections:[電機工程學系] 會議論文
    [光電工程研究所] 會議論文

    Files in This Item:

    File Description SizeFormat
    2030181030031.pdf805KbAdobe PDF558View/Open


    SFX Query


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback